Keeping hot chips cool

  • Authors:
  • Ruchir Puri;Leon Stok;Subhrajit Bhattacharya

  • Affiliations:
  • IBM T.J. Watson Research Center, Yorktown Heights, NY;IBM, Somers, NY;IBM T.J. Watson Research Center, Yorktown Heights, NY

  • Venue:
  • Proceedings of the 42nd annual Design Automation Conference
  • Year:
  • 2005

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Abstract

With 90nm CMOS in production and 65nm testing in progress, power has been pushed to the forefront of design metrics. This paper will outline practical techniques that are used to reduce both leakage as well as active power in a standard-cell library based high-performance design flow. We will discuss the design and cost issues for using different power saving techniques such as: power gating to reduce leakage, multiple and hybrid threshold libraries for leakage reduction and multiple supply voltage based design. In addition techniques to reduce clock tree power will be presented as power consumed in clocks accounts for a significant portion of total chip power. Practical aspects of implementing these techniques will also be discussed.