Software-assisted hardware reliability: abstracting circuit-level challenges to the software stack

  • Authors:
  • Vijay Janapa Reddi;Meeta S. Gupta;Michael D. Smith;Gu-yeon Wei;David Brooks;Simone Campanoni

  • Affiliations:
  • Harvard University, Cambridge;Harvard University, Cambridge;Harvard University, Cambridge;Harvard University, Cambridge;Harvard University, Cambridge;Politecnico di Milano, Milano, Italy

  • Venue:
  • Proceedings of the 46th Annual Design Automation Conference
  • Year:
  • 2009

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Abstract

Power constrained designs are becoming increasingly sensitive to supply voltage noise. We propose a hardware-software collaborative approach to enable aggressive operating margins: a checkpoint-recovery mechanism corrects margin violations, while a run-time software layer reschedules the program's instruction stream to prevent recurring margin crossings at the same program location. The run-time layer removes 60% of these events with minimal overhead, thereby significantly improving overall performance.