Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Statistical estimation of leakage current considering inter- and intra-die process variation
Proceedings of the 2003 international symposium on Low power electronics and design
Proceedings of the 2003 international symposium on Low power electronics and design
Parametric yield estimation considering leakage variability
Proceedings of the 41st annual Design Automation Conference
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
Proceedings of the 41st annual Design Automation Conference
Power Monitors: A Framework for System-Level Power Estimation Using Heterogeneous Power Models
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Full-chip analysis of leakage power under process variations, including spatial correlations
Proceedings of the 42nd annual Design Automation Conference
Variations-aware low-power design with voltage scaling
Proceedings of the 42nd annual Design Automation Conference
Leakage minimization of nano-scale circuits in the presence of systematic and random variations
Proceedings of the 42nd annual Design Automation Conference
ISLPED '05 Proceedings of the 2005 international symposium on Low power electronics and design
Probabilistic dual-Vth leakage optimization under variability
ISLPED '05 Proceedings of the 2005 international symposium on Low power electronics and design
Power efficiency for variation-tolerant multicore processors
Proceedings of the 2006 international symposium on Low power electronics and design
Considering process variations during system-level power analysis
Proceedings of the 2006 international symposium on Low power electronics and design
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Variation-tolerant dynamic power management at the system-level
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Software adaptation in quality sensitive applications to deal with hardware variability
Proceedings of the 20th symposium on Great lakes symposium on VLSI
AppAdapt: opportunistic application adaptation in presence of hardware variation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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