System-level process-driven variability analysis for single and multiple voltage-frequency island systems

  • Authors:
  • Diana Marculescu;Siddharth Garg

  • Affiliations:
  • Carnegie Mellon University, Pittsburgh, PA;Carnegie Mellon University, Pittsburgh, PA

  • Venue:
  • Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 2006

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Abstract

The problem of determining bounds for application completion times running on generic systems comprised of single or multiple voltage-frequency islands (VFIs) with arbitrary topologies is addressed in the context of manufacturing-driven variability. The approach provides an exact solution for the system-level timing yield in single clock, single voltage (SSV) and VFI systems with an underlying tree-based topology, and a tight upper bound for generic, non-tree based topologies. The results show that: (a) timing yield for overall source-to- sink completion time for generic systems can be modeled in an exact manner for both SSV and VFI systems; and (b) multiple VFI, latency-constrained systems can achieve 11--90% higher timing yield than their SSV counterparts. The results are proven formally and supported by experimental results on two embedded applications, namely software defined radio and MPEG2 encoder.