Birthday paradox, coupon collectors, caching algorithms and self-organizing search
Discrete Applied Mathematics
Intellectual Property Metering
IHW '01 Proceedings of the 4th International Workshop on Information Hiding
Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Probability and Computing: Randomized Algorithms and Probabilistic Analysis
Probability and Computing: Randomized Algorithms and Probabilistic Analysis
Analysis and modeling of CD variation for statistical static timing
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
CAD-based security, cryptography, and digital rights management
Proceedings of the 44th annual Design Automation Conference
SVD-Based Ghost Circuitry Detection
Information Hiding
Hardware Trojan horse detection using gate-level characterization
Proceedings of the 46th Annual Design Automation Conference
Gate-level characterization: foundations and hardware security applications
Proceedings of the 47th Design Automation Conference
Hardware aging-based software metering
Proceedings of the Conference on Design, Automation and Test in Europe
A first step towards automatic application of power analysis countermeasures
Proceedings of the 48th Design Automation Conference
Differential public physically unclonable functions: architecture and applications
Proceedings of the 48th Design Automation Conference
Integrated circuit security techniques using variable supply voltage
Proceedings of the 48th Design Automation Conference
Scalable segmentation-based malicious circuitry detection and diagnosis
Proceedings of the International Conference on Computer-Aided Design
Effective iterative techniques for fingerprinting design IP
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Malicious Circuitry Detection Using Thermal Conditioning
IEEE Transactions on Information Forensics and Security - Part 2
Securing netlist-level FPGA design through exploiting process variation and degradation
Proceedings of the ACM/SIGDA international symposium on Field Programmable Gate Arrays
Can EDA combat the rise of electronic counterfeiting?
Proceedings of the 49th Annual Design Automation Conference
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Current hardware metering techniques, which use manifestational properties of gates for ID extraction, are weakened by the non-uniform effects of aging in conjunction with variations in temperature and supply voltage. As an integrated circuit (IC) ages, the manifestational properties of the gates change, and thus the ID used for hardware metering can not be valid over time. Additionally, the previous approaches require large amounts of costly measurements and often are difficult to scale to large designs. We resolve the deleterious effects of aging by going to the physical level and primarily targeting the characterization of threshold voltage. Although threshold voltage is modified with aging, we can recover its original value for use as the IC identifier. Another key aspect of our approach involves using IC segmentation for gate-level characterization. This results in a cost effective approach by limiting measurements, and has a significant effect on the approach scalability. Finally, by using threshold voltage for ID creation, we are able to quantify the probability of coincidence between legitimate and pirated ICs, thus for the first time quantitatively and accurately demonstrating the effectiveness of a hardware metering approach.