Can EDA combat the rise of electronic counterfeiting?

  • Authors:
  • Farinaz Koushanfar;Saverio Fazzari;Carl McCants;William Bryson;Matthew Sale;Peilin Song;Miodrag Potkonjak

  • Affiliations:
  • Rice University, Houston, TX;Booz Allen Hamilton, Inc., Arlington, VA;Defense Advanced Research, Projects Agency, Arlington, VA;Analytical Solutions, Inc., Albuquerque, NM;U.S. Naval Surface Warfare Center, Crane, IN;IBM Research, Yorktown Heights, NY;University of California, Los Angeles, CA

  • Venue:
  • Proceedings of the 49th Annual Design Automation Conference
  • Year:
  • 2012

Quantified Score

Hi-index 0.00

Visualization

Abstract

The Semiconductor Industry Associates (SIA) estimates that counterfeiting costs the US semiconductor companies $7.5B in lost revenue, and this is indeed a growing global problem. Repackaging the old ICs, selling the failed test parts, as well as gray marketing, are the most dominant counterfeiting practices. Can technology do a better job than lawyers? What are the technical challenges to be addressed? What EDA technologies will work: embedding IP protection measures in the design phase, developing rapid post- silicon certification, or counterfeit detection tools and methods?