Circuit Failure Prediction and Its Application to Transistor Aging

Authors:
Mridul Agarwal;Bipul C. Paul;Ming Zhang;Subhasish Mitra
Affiliations:
Stanford University;Toshiba Corp.;Intel Corporation;Stanford University
Venue:
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Year:
2007

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Abstract

Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, ...