Reliability challenges of real-time systems in forthcoming technology nodes

Authors:
Said Hamdioui;Michael Nicolaidis;Dimitris Gizopoulos;Arnaud Grasset;Groeseneken Guido;Philippe Bonnot
Affiliations:
Delft University of Technology, The Netherlands;TIMA laboratory, Grenoble, France;University of Athens, Greece;Thales Research & Technology, Palaiseau, France;Imec Leuven and KU Leuven, Belgium;Thales Research & Technology, Palaiseau, France
Venue:
Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2013

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Abstract

Forthcoming technology nodes are posing major challenges on the manufacturing of reliable (real-time) systems: process variations, accelerated degradation aging, as well as external and internal noise are key examples. This paper focuses on real-time systems reliability and analyzes the state-of-the-art and the emerging reliability bottlenecks from three different perspectives: technology, circuit/IP and full system.