Timing-Error-Detecting Dual-Edge-Triggered Flip-Flop

  • Authors:
  • Kazuteru Namba;Takashi Katagiri;Hideo Ito

  • Affiliations:
  • Chiba University, Chiba, Japan 263-8522;Chiba University, Chiba, Japan 263-8522;Chiba University, Chiba, Japan 263-8522

  • Venue:
  • Journal of Electronic Testing: Theory and Applications
  • Year:
  • 2013

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Abstract

This paper presents a construction of timing-error-detecting dual-edge-triggered flip-flops (DET-FFs). The proposed FF is based on a conventional DET-FF and a conventional timing error detection method. While the conventional timing error detection uses a transition detector with relatively large area, the proposed FF uses internal signals in a DET-FF as as an alternative to the transition detector. This paper also shows an evaluation result indicating that the proposed FF has smaller area overhead than the simple combination of the conventional DET-FF and timing error detection methods.