MiBench: A free, commercially representative embedded benchmark suite
WWC '01 Proceedings of the Workload Characterization, 2001. WWC-4. 2001 IEEE International Workshop
Circuit Failure Prediction and Its Application to Transistor Aging
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
CASP: concurrent autonomous chip self-test using stored test patterns
Proceedings of the conference on Design, automation and test in Europe
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This paper proposes a stochastic framework for error rate estimation that models adaptive speed control as a continuous-time Markov process and derives its transition rates using developed similarity database. The proposed framework is implemented for adaptive speed control systems based on timing error prediction and scan-test. Experimental results show that the proposed framework enabled 12 orders of magnitude faster MTTF estimation than ordinary logic simulation. The accuracy of MTTF estimation under random delay fluctuation is clarified through a comparison with logic simulation. The proposed estimation can contribute to design and validation of adaptive speed control systems with field delay testing.