Cross-layer resilience challenges: metrics and optimization

  • Authors:
  • Subhasish Mitra;Kevin Brelsford;Pia N. Sanda

  • Affiliations:
  • Stanford University, Stanford, CA;Stanford University, Stanford, CA;IBM Corporation, Poughkeepsie, NY

  • Venue:
  • Proceedings of the Conference on Design, Automation and Test in Europe
  • Year:
  • 2010

Quantified Score

Hi-index 0.00

Visualization

Abstract

With increasing sources of disturbances in the underlying hardware, a key challenge in design of robust systems is to meet user expectations at required cost. Cross-layer resilience techniques, implemented across multiple layers of the system stack and designed to work together, can help system designers build effective robust systems at the desired cost point. This paper brings to the forefront two major cross-layer resilience challenges: 1. Quantification and validation of the effectiveness of a cross-layer resilience approach to robust system design in overcoming hardware reliability challenges. 2. Global optimization of a robust system design using cross-layer resilience techniques.