Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation

  • Authors:
  • Shekhar Borkar

  • Affiliations:
  • Intel Corp.

  • Venue:
  • IEEE Micro
  • Year:
  • 2005

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Abstract

As technology scales, variability will continue to become worse. Random dopantfluctuations and sub-wavelength lithography will yield static variations, supply voltageand temperature variations will affect circuit performance and leakage power, soft-errorrates will continue to rise, and transistor aging will become worse. We discuss theseeffects and propose solutions to build reliable systems with billions of unreliablecomponents.