Reliability analysis reloaded: how will we survive?

Authors:
Robert Aitken;Görschwin Fey;Zbigniew T. Kalbarczyk;Frank Reichenbach;Matteo Sonza Reorda
Affiliations:
ARM Incorporation, San Jose, CA;German Aerospace Center, Bremen, Germany;University of Illinois at Urbana-Champaign, Urbana, IL;ABB Corporate Research, Billingstad, Norway;Politecnico di Torino, Torino, Italy
Venue:
Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2013

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Abstract

In safety related applications and in products with long lifetimes reliability is a must. Moreover, facing future technology nodes of integrated circuit device level reliability may decrease, i.e., counter-measures have to be taken to ensure product level reliability. But assessing the reliability of a large system is not a trivial task. This paper revisits the state-of-the-art in reliability evaluation starting from the physical device level, to the software system level, all the way up to the product level. Relevant standards and future trends are discussed.