Graph-Based Algorithms for Boolean Function Manipulation
IEEE Transactions on Computers
Transition density, a stochastic measure of activity in digital circuits
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Estimation of average switching activity in combinational and sequential circuits
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
A survey of power estimation techniques in VLSI circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on low-power design
A methodology for efficient estimation of switching activity in sequential logic circuits
DAC '94 Proceedings of the 31st annual Design Automation Conference
Exact and approximate methods for calculating signal and transition probabilities in FSMs
DAC '94 Proceedings of the 31st annual Design Automation Conference
Switching activity analysis for sequential circuits using Boolean approximation method
ISLPED '96 Proceedings of the 1996 international symposium on Low power electronics and design
Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
DSN '02 Proceedings of the 2002 International Conference on Dependable Systems and Networks
An Accurate SER Estimation Method Based on Propagation Probability
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Multiple Transient Faults in Logic: An Issue for Next Generation ICs
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Soft Error Modeling and Protection for Sequential Elements
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
MARS-C: modeling and reduction of soft errors in combinational circuits
Proceedings of the 43rd annual Design Automation Conference
Soft error rate analysis for sequential circuits
Proceedings of the conference on Design, automation and test in Europe
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells
IOLTS '07 Proceedings of the 13th IEEE International On-Line Testing Symposium
The Boolean Difference and Multiple Fault Analysis
IEEE Transactions on Computers
A systematic approach to modeling and analysis of transient faults in logic circuits
ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
Probabilistic methods for the impact of an SET in combinational logic
IOLTS '10 Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium
A timing-aware probabilistic model for single-event-upset analysis
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Probabilistic Approach to Diagnose SETs
DFT '11 Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
On variable clock methods for path delay testing of sequential circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Circuit Reliability Analysis Using Symbolic Techniques
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Exact Delay Fault Coverage in Sequential Logic Under Any Delay Fault Model
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Modeling and Optimization for Soft-Error Reliability of Sequential Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
| Hi-index | 0.00 |
In recent work, the error latching probability due to an SET is calculated for a single observable point, and this help in hardening the design. This paper utilizes a recently proposed probabilistic framework for SET propagation in order to diagnose the location and time of strike based on errors observed at multiple points. The proposed diagnostic framework requires a new approach to calculate the probability for SET propagation to multiple non-independent variables. It is shown experimentally that error appearances at multiple observable points help in SET diagnosis. The time performance of the proposed diagnostic framework is compared against an alternative implementation. This is particularly important in on-line diagnosis.