A Probabilistic Approach to Diagnose SETs

  • Authors:

  • Sreenivas Gangadhar;Spyros Tragoudas

  • Affiliations:

  • -;-

  • Venue:
  • DFT '11 Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
  • Year:
  • 2011

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Abstract

In recent work, the error latching probability due to an SET is calculated for a single observable point, and this help in hardening the design. This paper utilizes a recently proposed probabilistic framework for SET propagation in order to diagnose (on-line or off-line) the location and time of strike based on errors observed at multiple points. The proposed diagnostic framework requires a new approach to calculate the probability for SET propagation to multiple non-independent variables. It is shown experimentally that error appearances at multiple observable points help in SET diagnosis. The time performance of the proposed diagnostic framework is compared against an alternative implementation. This is particularly important in on-line diagnosis.