Transition density, a stochastic measure of activity in digital circuits

  • Authors:
  • Farid N. Najm

  • Affiliations:
  • Semiconductor Process & Design Center, Texas Instruments Inc., MS 369, Dallas, Texas

  • Venue:
  • DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
  • Year:
  • 1991

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Abstract