Transition density, a stochastic measure of activity in digital circuits
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
EURO-DAC '94 Proceedings of the conference on European design automation
Circuit implementation of a 300-MHz 64-bit second-generation CMOS Alpha CPU
Digital Technical Journal - Special 10th anniversary issue
Hot-carrier reliability enhancement via input reordering and transistor sizing
DAC '96 Proceedings of the 33rd annual Design Automation Conference
DAC '96 Proceedings of the 33rd annual Design Automation Conference
The Case for Lifetime Reliability-Aware Microprocessors
Proceedings of the 31st annual international symposium on Computer architecture
Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Fault tolerant bus architecture for deep submicron based processors
ACM SIGARCH Computer Architecture News - Special issue: Workshop on architectural support for security and anti-virus (WASSA)
Electromigration for microarchitects
ACM Computing Surveys (CSUR)
Lifetime reliability-aware task allocation and scheduling for MPSoC platforms
Proceedings of the Conference on Design, Automation and Test in Europe
Mapping of applications to MPSoCs
CODES+ISSS '11 Proceedings of the seventh IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Mitigating electromigration of power supply networks using bidirectional current stress
Proceedings of the great lakes symposium on VLSI
Cross-layer virtual observers for embedded multiprocessor system-on-chip (MPSoC)
Proceedings of the 11th International Workshop on Adaptive and Reflective Middleware
Design configuration selection for hard-error reliable processors via statistical rules
Microprocessors & Microsystems
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