Hot-carrier reliability enhancement via input reordering and transistor sizing

  • Authors:
  • Aurobindo Dasgupta;Ramesh Karri

  • Affiliations:
  • Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA;Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA

  • Venue:
  • DAC '96 Proceedings of the 33rd annual Design Automation Conference
  • Year:
  • 1996

Quantified Score

Hi-index 0.00

Visualization

Abstract