Layout-driven hot-carrier degradation minimization using logic restructuring techniques

Authors:
Chih-Wei Chang;Kai Wang;Malgorzata Marek-Sadowska
Affiliations:
Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA;Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA;Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA
Venue:
Proceedings of the 38th annual Design Automation Conference
Year:
2001

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