Statistical Timing Analysis of Combinational Circuits

Hot-carrier reliability enhancement via input reordering and transistor sizing

DAC '96 Proceedings of the 33rd annual Design Automation Conference

Statistical timing analysis using bounds and selective enumeration

Proceedings of the 8th ACM/IEEE international workshop on Timing issues in the specification and synthesis of digital systems

Statistical timing analysis using bounds and selective enumeration

Proceedings of the 8th ACM/IEEE international workshop on Timing issues in the specification and synthesis of digital systems

Computation and Refinement of Statistical Bounds on Circuit Delay

Proceedings of the 40th annual Design Automation Conference

Block-based Static Timing Analysis with Uncertainty

Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design

Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations

Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design

Statistical Timing Analysis Using Bounds

DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

On Statistical Timing Analysis with Inter- and Intra-Die Variations

Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

Improving the Process-Variation Tolerance of Digital Circuits Using Gate Sizing and Statistical Techniques

Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

Statistical delay computation considering spatial correlations

ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference

Variability-driven module selection with joint design time optimization and post-silicon tuning

Proceedings of the 2008 Asia and South Pacific Design Automation Conference

A fuzzy optimization approach for variation aware power minimization during gate sizing

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Timing-based placement considering uncertainty due to process variations

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

NBTI-aware circuit node criticality computation

ACM Journal on Emerging Technologies in Computing Systems (JETC)