Logic synthesis for reliability—an early start to controlling electromigration and hot carrier effects

Authors:
Kaushik Roy;Sharat Prasad
Affiliations:
School of Electrical Engineering, Purdue University, West Lafayette, Indiana;Integrated Systems Laboratory, Texas Instruments, Dallas, Texas
Venue:
EURO-DAC '94 Proceedings of the conference on European design automation
Year:
1994

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Abstract