On average power dissipation and random pattern testability of CMOS combinational logic networks

  • Authors:
  • Amelia Shen;Abhijit Ghosh;Srinivas Devadas;Kurt Keutzer

  • Affiliations:
  • Massachusetts Institute of Technology, Cambridge, MA;Mitsubishi Electric Research Laboratories, Sunnyvale, CA;Massachusetts Institute of Technology, Cambridge, MA;Synopsys, Mountain View, CA

  • Venue:
  • ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 1992

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Abstract