On the design of low power BIST for multipliers with Booth encoding and Wallace tree summation

Authors:
Dimitris Bakalis;Emmanouil Kalligeros;Dimitris Nikolos;Haridimos T. Vergos;George Alexiou
Affiliations:
Department of Computer Engineering and Informatics, University of Patras, 26 500, Patras, Greece, Computer Technology Institute, 61 Riga Feraiou Street, 26221 Patras, Greece;Department of Computer Engineering and Informatics, University of Patras, 26 500, Patras, Greece, Computer Technology Institute, 61 Riga Feraiou Street, 26221 Patras, Greece;Department of Computer Engineering and Informatics, University of Patras, 26 500, Patras, Greece, Computer Technology Institute, 61 Riga Feraiou Street, 26221 Patras, Greece;Department of Computer Engineering and Informatics, University of Patras, 26 500, Patras, Greece, Computer Technology Institute, 61 Riga Feraiou Street, 26221 Patras, Greece;Department of Computer Engineering and Informatics, University of Patras, 26 500, Patras, Greece, Computer Technology Institute, 61 Riga Feraiou Street, 26221 Patras, Greece
Venue:
Journal of Systems Architecture: the EUROMICRO Journal
Year:
2002

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Abstract

Low power dissipation (PD) during testing is emerging as one of the major objectives of a built-in self-test (BIST) designer. In this paper we examine the testability of multipliers based on Booth encoding and Wallace tree summation of the partial products and we present a methodology for deriving a low power BIST scheme for them. We propose several design rules for designing the Wallace tree in order to be fully testable under the cell fault model. The proposed low power BIST scheme for the derived multipliers is achieved by: (a) introducing suitable test pattern generators (TPGs), (b) properly assigning the TPG outputs to the multiplier inputs and (c) significantly reducing the test set length. Results indicate that the total power dissipated, the average power per test vector and the peak PD during testing can be reduced up to 73%, 27% and 36% respectively with respect to earlier schemes, depending on the implementation of the basic cells and the size of the multiplier. The test application time is also significantly reduced, while the introduced BIST scheme implementation area is small.