Switching activity analysis for sequential circuits using Boolean approximation method

Authors:
T. Uchino;F. Minami;M. Murakata;T. Mitsuhashi
Affiliations:
Semiconductor DA & Test Engineering Center, Toshiba Corp., 580-1, Horikawa-cho, Saiwai-ku, Kawasaki 210, Japan;Semiconductor DA & Test Engineering Center, Toshiba Corp., 580-1, Horikawa-cho, Saiwai-ku, Kawasaki 210, Japan;Semiconductor DA & Test Engineering Center, Toshiba Corp., 580-1, Horikawa-cho, Saiwai-ku, Kawasaki 210, Japan;Semiconductor DA & Test Engineering Center, Toshiba Corp., 580-1, Horikawa-cho, Saiwai-ku, Kawasaki 210, Japan
Venue:
ISLPED '96 Proceedings of the 1996 international symposium on Low power electronics and design
Year:
1996

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