Computing the entire active area/power consumption versus delay trade-off curve for gate sizing with a piecewise linear simulator

Authors:
Michel R. C. M. Berkelaar;Pim H. W. Buurman;Jochen A. G. Jess
Affiliations:
IBM T.J. Watson Research Center, Yorktown Heights, NY and Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands;Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands;Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands
Venue:
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Year:
1994

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Abstract

The gate sizing problem is the problem of finding load drive capabilities for all gates in a given Boolean network such, that a given delay limit is kept, and the necessary cost in terms of active area usage and/or power consumption is minimal. This paper describes a way to obtain the entire cost versus delay trade-off curve of a combinational logic circuit in an efficient way. Every point on the resulting curve is the global optimum of the corresponding gate sizing problem. The problem is solved by mapping it onto piecewise linear models in such a way, that a piecewise linear (circuit) simulator can do the job. It is shown that this setup is very efficient, and can produce trade-off curves for large circuits (thousands of gates) in a few minutes. Benchmark results for the entire set of MCNC '91 two-level examples are given.