IEEE Transactions on Computers
A New Framework for Designing and Analyzing BIST Techniques and Zero Aliasing Compression
IEEE Transactions on Computers
Transition density, a stochastic measure of activity in digital circuits
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes
IEEE Transactions on Computers
A symbolic simulation approach in resolving signals' correlation
SS '96 Proceedings of the 29th Annual Simulation Symposium (SS '96)
A new framework for designing & analyzing BIST techniques: computation of exact aliasing probability
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
| Hi-index | 14.99 |
In [2] Savir, Ditlow, and Bardell presented an algorithm for estimating the signal probability of a line in combinational circuits, but were unable to show that the algorithm always produced correct results. This paper shows that their algorithm for cutting reconvergent fan-out lines in a circuit eventually produces a circuit without reconvergent fan- out that can be used to estimate signal probabilities in all lines of the original circuit.