A new framework for designing & analyzing BIST techniques: computation of exact aliasing probability

Authors:
Sandeep K. Gupta;Dhiraj K. Pradhan
Affiliations:
Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, Massachusetts;Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, Massachusetts
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

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Abstract

A coding theory framework is developed for analysis and synthesis of compression techniques in the BIST environment. Using this framework, exact expressions are derived for the LFSR aliasing probability. These are shown to be more accurate than earlier ones. Also shown is that there exist compression techniques for which the aliasing probability can be reduced to aero asymptotically. A new error model is presented that incorporates the effects of faults on output response. It is shown that the coding theory framework correlates well with this proposed error model. Finally, a new signature analysis technique is presented, which achieves smaller aliasing probability than other recently proposed schemes.