Transition density, a stochastic measure of activity in digital circuits
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
JRoute: A Run-Time Routing API for FPGA Hardware
IPDPS '00 Proceedings of the 15 IPDPS 2000 Workshops on Parallel and Distributed Processing
VPR: A new packing, placement and routing tool for FPGA research
FPL '97 Proceedings of the 7th International Workshop on Field-Programmable Logic and Applications
Active leakage power optimization for FPGAs
FPGA '04 Proceedings of the 2004 ACM/SIGDA 12th international symposium on Field programmable gate arrays
Circuit Level Reliability Analysis of Cu Interconnects
ISQED '04 Proceedings of the 5th International Symposium on Quality Electronic Design
The Impact of Technology Scaling on Lifetime Reliability
DSN '04 Proceedings of the 2004 International Conference on Dependable Systems and Networks
Leakage control in FPGA routing fabric
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Reliability limits for the gate insulator in CMOS technology
IBM Journal of Research and Development
An autonomous fault tolerant system for CAN communications
IEA/AIE'10 Proceedings of the 23rd international conference on Industrial engineering and other applications of applied intelligent systems - Volume Part III
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration
Journal of Electronic Testing: Theory and Applications
A low-cost fault tolerant solution targeting commercial FPGA devices
Journal of Systems Architecture: the EUROMICRO Journal
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Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vulnerable to permanent damage and failures due to different physical phenomenon. Such concerns have been recently demonstrated for regular micro-architectures. In this work we demonstrate the vulnerability of Field Programmable Gate Arrays (FPGA)s to two different types of hard errors, namely, Time Dependent Dielectric Breakdown (TDDB) and Electro-migration. We also analyze the performance degradation of FPGAs over time caused by Hot Carrier Effects (HCE). We also propose three novel techniques to counter such aging based failures and increase the lifetime of the device.