Leakage current estimation of CMOS circuit with stack effect

  • Authors:
  • Yong-Jun Xu;Zu-Ying Luo;Xiao-Wei Li;Li-Jian Li;Xian-Long Hong

  • Affiliations:
  • Institute of Computing Technology, The Chinese Academy of Sciences, Beijing 100080, P.R. China and Graduate School of Chinese Academy of Sciences, Beijing 100039, P.R. China;Department of Computer Science and Technology, Tsinghua University, Beijing 100084, P.R. China;Institute of Computing Technology, The Chinese Academy of Sciences, Beijing 100080, P.R. China and Graduate School of Chinese Academy of Sciences, Beijing 100039, P.R. China;National ASIC Design Engineering Center, Institute of Automation, The Chinese Academy of Sciences, Beijing 100080, P.R. China;Department of Computer Science and Technology, Tsinghua University, Beijing 100084, P.R. China

  • Venue:
  • Journal of Computer Science and Technology - Special issue on computer graphics and computer-aided design
  • Year:
  • 2004

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Abstract

Leakage current of CMOS circuit increases dramatically with the technology scaling down and has become a critical issue of high performance system. Subthreshold, gate and reverse biased junction band-to-band tunneling (BTBT) leakages are considered three main determinants of total leakage current. Up to now, how to accurately estimate leakage current of large-scale circuits within endurable time remains unsolved, even though accurate leakage models have been widely discussed. In this paper, the authors first dip into the stack effect of CMOS technology and propose a new simple gate-level leakage current model. Then, a table-lookup based total leakage current simulator is built up according to the model. To validate the simulator, accurate leakage current is simulated at circuit level using popular simulator HSPICE for comparison. Some further studies such as maximum leakage current estimation, minimum leakage current generation and a high-level average leakage current macromodel are introduced in detail. Experiments on ISCAS85 and ISCAS89 benchmarks demonstrate that the two proposed leakage current estimation methods are very accurate and efficient.