IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
| Hi-index | 0.00 |
The undisputed increase in Ioff and large variations in Ioff -- combined with Ion/Ioff ratio approaching unity -- leads to transistors that become increasing unreliable and unpredictable switches. A more comprehensive motivation is made on why therefore there are compelling benefits to design based on probabilistic methods. However, given the maturity of our industry, it is more likely that this will be realized in evolutionary steps toward such an ultimate change in our design and thought process. While this is a barrier for revolutionary innovation, it is likely the best possible mode for widespread commercial success. A potential three phase evolutionary roadmap towards that ultimate true probabilistic design is presented as well.