A framework for estimating NBTI degradation of microarchitectural components

Authors:
Michael DeBole;K. Ramakrishnan;Varsha Balakrishnan;Wenping Wang;Hong Luo;Yu Wang;Yuan Xie;Yu Cao;N. Vijaykrishnan
Affiliations:
The Pennsylvania State University, University Park, PA;The Pennsylvania State University, University Park, PA;Arizona State University, Tempe, AZ;Arizona State University, Tempe, AZ;Tsinghua University, Beijing, China;Tsinghua University, Beijing, China;The Pennsylvania State University, University Park, PA;Arizona State University, Tempe, AZ;The Pennsylvania State University, University Park, PA
Venue:
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Year:
2009

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Abstract

Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool includes workload-based temperature and performance degradation analysis across a variety of technologies and operating conditions, revealing a complex interplay between factors influencing NBTI timing degradation.