The Case for Lifetime Reliability-Aware Microprocessors
Proceedings of the 31st annual international symposium on Computer architecture
MiBench: A free, commercially representative embedded benchmark suite
WWC '01 Proceedings of the Workload Characterization, 2001. WWC-4. 2001 IEEE International Workshop
Reliability challenges for 45nm and beyond
Proceedings of the 43rd annual Design Automation Conference
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Proceedings of the 43rd annual Design Automation Conference
Characterizing process variation in nanometer CMOS
Proceedings of the 44th annual Design Automation Conference
NBTI Degradation: A Problem or a Scare?
VLSID '08 Proceedings of the 21st International Conference on VLSI Design
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation
ISQED '08 Proceedings of the 9th international symposium on Quality Electronic Design
NBTI aware workload balancing in multi-core systems
ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
On the efficacy of input Vector Control to mitigate NBTI effects and leakage power
ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
Workload capacity considering NBTI degradation in multi-core systems
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
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Negative-Bias Temperature Instability seriously affects nanoscale circuits reliability and performance. Continuous stress and increasing operating temperatures lead to device degradation and long-term system unavailability. The opportunity to optimize the duty-cycle of the stress/recovery phases to reduce Vth degradation leads to innovative research of reliability-oriented resources allocation at architectural level. This work explores the impact of different allocation strategies on the processor degradation, through a novel estimation methodology. Experimental results show that the proposed NBTI-aware allocation strategy can guarantee from 10% and up to 30% lower degradation compared to classical strategies, under different operating scenarios and under process variability.