Online circuit reliability monitoring
Proceedings of the 19th ACM Great Lakes symposium on VLSI
Statistical reliability analysis under process variation and aging effects
Proceedings of the 46th Annual Design Automation Conference
NBTI-aware DVFS: a new approach to saving energy and increasing processor lifetime
Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design
NBTI modeling in the framework of temperature variation
Proceedings of the Conference on Design, Automation and Test in Europe
Optimized self-tuning for circuit aging
Proceedings of the Conference on Design, Automation and Test in Europe
NBTI mitigation in microprocessor designs
Proceedings of the great lakes symposium on VLSI
Methods for fault tolerance in networks-on-chip
ACM Computing Surveys (CSUR)
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Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase in the magnitude of PMOS threshold voltage, resulting in the degradation of circuit performance over time. NBTI is highly sensitive to operating temperature, making the amount of degradation strongly dependent on the thermal history of the chip. In order to accurately predict the amount of threshold voltage increase, the precise temperature profile must be utilized. The existing models are based on the simplified analysis which assumes that the temperature takes up to two possible fixed values over time. These models are inaccurate when predicting the impact of continuously-changing temperature that spans a large range. Our experiments show that proposed model accounting for temperature variation provides a significantly tighter bound for the simulation than that from the model that ignores the temperature variation and assumes a constant (worst-case) temperature. In our experiment, the amount of degradation predicted by the proposed dynamic temperature model is on average 46% less conservative compared to the model based on the worst-case temperature.