Workload capacity considering NBTI degradation in multi-core systems
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
NBTI mitigation in microprocessor designs
Proceedings of the great lakes symposium on VLSI
Alleviating NBTI-induced failure in off-chip output drivers
Proceedings of the great lakes symposium on VLSI
Towards graceful aging degradation in NoCs through an adaptive routing algorithm
Proceedings of the 49th Annual Design Automation Conference
Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI
VAWOM: temperature and process variation aware wearout management in 3D multicore architecture
Proceedings of the 50th Annual Design Automation Conference
An MILP-based aging-aware routing algorithm for NoCs
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Unified reliability estimation and management of NoC based chip multiprocessors
Microprocessors & Microsystems
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As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such as Negative Bias Temperature Instability (NBTI). Unless this problem is addressed, chip multi-processor (CMP) systems face low yields and short mean-time-to-failure (MTTF). This paper proposes a new design framework for multi-core system that includes device wear-out impact. Based on device fractional NBTI model, we propose a new NBTI aware system workload model, and develop new dynamic tile partition (DTP) algorithm to balance workload among active cores while relaxing stressed ones. Experimental results on 64 cores show that by allowing a small number of cores (around 10%)to relax in a short time period (10 second), the proposed methodology improves CMP system yield. We use the percentage of core failure to represent the yield improvement. The new strategy improves the core failure number by 20 %, and extend MTTF by 30% with little degradation in performance (less than 6%).