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Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
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Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
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Integration, the VLSI Journal
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Proceedings of the Conference on Design, Automation and Test in Europe
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Proceedings of the great lakes symposium on VLSI
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Proceedings of the Conference on Design, Automation and Test in Europe
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Proceedings of the Conference on Design, Automation and Test in Europe
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Systematic and random variability analysis of two different 6T-SRAM layout topologies
Microelectronics Journal
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The correlation of a statistical analysis tool to hardware depends on the accuracy of underlying variation models. The models should represent actual process behavior as measured in silicon. In this paper, we present an overview of test structures for characterizing statistical variation of process parameters. We discuss the test structure design and characterization strategy for calibrating random and layout dependent systematic components of process variation. We also show measurement results from several fabricated structures in 65-nm CMOS technologies.