Statistical static timing analysis: how simple can we get?
Proceedings of the 42nd annual Design Automation Conference
Temperature-aware NBTI modeling and the impact of input vector control on performance degradation
Proceedings of the conference on Design, automation and test in Europe
NBTI-aware synthesis of digital circuits
Proceedings of the 44th annual Design Automation Conference
Characterizing process variation in nanometer CMOS
Proceedings of the 44th annual Design Automation Conference
Proceedings of the 45th annual Design Automation Conference
Adaptive techniques for overcoming performance degradation due to aging in digital circuits
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Scheduled voltage scaling for increasing lifetime in the presence of NBTI
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Gate replacement techniques for simultaneous leakage and aging optimization
Proceedings of the Conference on Design, Automation and Test in Europe
MODEST: a model for energy estimation under spatio-temporal variability
Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design
Minimizing leakage power in aging-bounded high-level synthesis with design time multi-Vth assignment
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
A novel statistical and circuit-based technique for counterfeit detection in existing ICs
Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI
Variation-aware supply voltage assignment for simultaneous power and aging optimization
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Employing circadian rhythms to enhance power and reliability
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Virtually-aged sampling DMR: unifying circuit failure prediction and circuit failure detection
Proceedings of the 46th Annual IEEE/ACM International Symposium on Microarchitecture
Hi-index | 0.00 |
As technology scales, Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. And the growing process variations can no longer be ignored. Meanwhile, reducing leakage power remains to be one of the design goals. In this paper, we first present a platform for NBTI-aware statistical timing and leakage power analysis. A variation-aware supply voltage assignment (SVA) technique combining dual Vdd assignment and dynamic Vdd scaling techniques is proposed to minimize NBTI degradation and leakage. Based on the statistical platform, we analyze the impact of Vth variations on NBTI degradation and leakage. The experimental results show that our SVA technique can mitigate on average 52.98% of NBTI degradation with little or without leakage power increase; furthermore, it can reduce on average 32.46% more leakage power compared with the pure single Vdd scaling technique. Compared with scheduled voltage scaling technique [9], our dynamic scaling technique is more effective because the circuit delay will exactly meet the specification at each dynamically decided time node during circuit operation.