Proceedings of the 38th annual Design Automation Conference
Manufacturing-Aware Physical Design
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Electronics beyond nano-scale CMOS
Proceedings of the 43rd annual Design Automation Conference
Active hardware metering for intellectual property protection and security
SS'07 Proceedings of 16th USENIX Security Symposium on USENIX Security Symposium
VTS '09 Proceedings of the 2009 27th IEEE VLSI Test Symposium
Variation-aware supply voltage assignment for minimizing circuit degradation and leakage
Proceedings of the 14th ACM/IEEE international symposium on Low power electronics and design
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Previously used ICs, which are resold as new, result in undue lost revenue, cause lower performance, reduced life span, and even catastrophic failure of platforms and systems. Non-invasive and inexpensive techniques are needed to establish the authenticity of such ICs that do not have special in-built structures for counterfeit detection. Although delay of circuit increases with its age, it cannot directly reveal the age of the chip, as it is also greatly influenced by process variation. In this work, we show that the relationship between two or more paths within the chip is a great indicator of its age. Using the proposed statistical and circuit-level technique, we observe over 97% correct detection of an aged IC from a new IC.