Lens aberration aware timing-driven placement
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Characterizing process variation in nanometer CMOS
Proceedings of the 44th annual Design Automation Conference
Extraction of statistical timing profiles using test data
Proceedings of the 44th annual Design Automation Conference
Lens aberration aware placement for timing yield
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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