Low power aging-aware register file design by duty cycle balancing

Authors:
Shuai Wang;Tao Jin;Chuanlei Zheng;Guangshan Duan
Affiliations:
Nanjing University, Nanjing, Jiang Su, China;Nanjing University, Nanjing, Jiang Su, China;Nanjing University, Nanjing, Jiang Su, China;Nanjing University, Nanjing, Jiang Su, China
Venue:
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2012

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Abstract

The degradation of CMOS devices over the lifetime can cause the severe threat to the system performance and reliability at deep submicron semiconductor technologies. The negative bias temperature instability (NBTI) is among the most important sources of the aging mechanisms. Applying the traditional guardbanding technique to address the decreased speed of devices is too costly. Due to presence of the narrow-width values, integer register files in high-performance microprocessors suffer a very high NBTI stress. In this paper, we propose an aging-aware register file (AARF) design to combat the NBTI-induced aging in integer register files. The proposed AARF design can mitigate the negative aging effects by balancing the duty cycle ratio of the internal bits in register files. By gating the leading bits of the narrow-width values during the register accesses, our AARF can also achieve a significantly power reduction, which will further reduce the temperature and NBTI degradation of integer register files. Our experimental results show that AARF can effectively reduce the NBTI stress with a 36.9% power saving for integer register files.