MTTF-balanced pipeline design

Authors:
Fabian Oboril;Mehdi B. Tahoori
Affiliations:
Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany;Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany
Venue:
Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2013

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Abstract

As CMOS technologies enter nanometer scales, microprocessors become more vulnerable to transistor aging mainly due to Bias Temperature Instability and Hot Carrier Injection. These phenomena lead to increasing device delays during the operational lifetime, which results in increasing pipeline stage delays. However, the aging rates of different stages are different. Hence, a previously delay-balanced pipeline becomes increasingly imbalanced resulting in a non-optimized design in terms of Mean Time to Failure (MTTF), frequency, area and power consumption. In this paper, we propose an MTTF-balanced pipeline design, in which the pipeline stage delays are balanced after the desired lifetime rather than at design time. This can lead to significant MTTF (lifetime) improvements as well as additional performance, area, and power benefits. Our experimental results show that MTTF of the FabScalar microprocessor can be improved by 2x (or frequency by 3%) while achieving an additional 4% power, and 1% area optimization.