Computer Architecture: A Quantitative Approach
Computer Architecture: A Quantitative Approach
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Impact of NBTI on SRAM Read Stability and Design for Reliability
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
New Generation of Predictive Technology Model for Sub-45nm Design Exploration
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Design tools for reliability analysis
Proceedings of the 43rd annual Design Automation Conference
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Proceedings of the 43rd annual Design Automation Conference
Reliability modeling and management in dynamic microprocessor-based systems
Proceedings of the 43rd annual Design Automation Conference
Temperature-aware circuit design using adaptive body biasing
Proceedings of the 17th ACM Great Lakes symposium on VLSI
Combating NBTI Degradation via Gate Sizing
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
Circuit Failure Prediction and Its Application to Transistor Aging
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout
IOLTS '07 Proceedings of the 13th IEEE International On-Line Testing Symposium
Proceedings of the 44th annual Design Automation Conference
The impact of NBTI on the performance of combinational and sequential circuits
Proceedings of the 44th annual Design Automation Conference
Static electromigration analysis for on-chip signal interconnects
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Gate sizing to radiation harden combinational logic
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
NBTI tolerant microarchitecture design in the presence of process variation
Proceedings of the 41st annual IEEE/ACM International Symposium on Microarchitecture
SRAM-based NBTI/PBTI sensor system design
Proceedings of the 47th Design Automation Conference
NBTI-aware DVFS: a new approach to saving energy and increasing processor lifetime
Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design
Aging-resilient design of pipelined architectures using novel detection and correction circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Reliability- and process variation-aware placement for FPGAs
Proceedings of the Conference on Design, Automation and Test in Europe
A linear programming approach for minimum NBTI vector selection
Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI
Input and transistor reordering for NBTI and HCI reduction in complex CMOS gates
Proceedings of the great lakes symposium on VLSI
Alleviating NBTI-induced failure in off-chip output drivers
Proceedings of the great lakes symposium on VLSI
M-IVC: Applying multiple input vectors to co-optimize aging and leakage
Microelectronics Journal
Proceedings of the International Conference on Computer-Aided Design
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Reliability has become a practical concern in today's VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance warnings before system errors occur. This paper presents a reliability monitor design for NBTI (Negative Bias Temperature Instability). NBTI is recognized as very critical as it leads to short device lifetime. The proposed reliability monitor not only tracks the NBTI effect but also mitigates the degradation by forward biasing the PMOS. A worst case scenario static stress experiment demonstrates two orders of magnitude improvement in system lifetime using PTM 65nm technology. A ring oscillator example shows how frequency degradation can be compensated. Deployment of the proposed NBTI monitor is also discussed and two compatible strategies are provided to incorporate these monitors efficiently: the first focuses on low area overhead while the second features low power.