Full-chip verification methods for DSM power distribution systems
DAC '98 Proceedings of the 35th annual Design Automation Conference
Electromigration-Aware Physical Design of Integrated Circuits
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Static electromigration analysis for on-chip signal interconnects
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
NBTI resilient circuits using adaptive body biasing
Proceedings of the 18th ACM Great Lakes symposium on VLSI
On-chip em-sensitive interconnect structures
Proceedings of the 12th ACM/IEEE international workshop on System level interconnect prediction
Aging analysis at gate and macro cell level
Proceedings of the International Conference on Computer-Aided Design
Sensing nanosecond-scale voltage attacks and natural transients in FPGAs
Proceedings of the ACM/SIGDA international symposium on Field programmable gate arrays
Hi-index | 0.00 |
Recent progress in EDA tools allows IC designs to be accurately verified with consequent improvements in yield and performance through reduced guard bands. This paper will present a tools perspective, including the primary effects such as HCI, NBTI and EM for which EDA tools are available, types of tools (dynamic simulation vs. static rule checking) and necessary reliability infrastructure and flows that have been working in practice. Finally, developing areas and future opportunities will be addressed.