Design Challenges of Technology Scaling
IEEE Micro
Leakage current reduction in CMOS VLSI circuits by input vector control
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Exact and heuristic approaches to input vector control for leakage power reduction
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Proceedings of the 43rd annual Design Automation Conference
An analytical model for negative bias temperature instability
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Temperature-aware NBTI modeling and the impact of input vector control on performance degradation
Proceedings of the conference on Design, automation and test in Europe
The impact of NBTI on the performance of combinational and sequential circuits
Proceedings of the 44th annual Design Automation Conference
NBTI-aware synthesis of digital circuits
Proceedings of the 44th annual Design Automation Conference
Probabilistic Treatment of General Combinational Networks
IEEE Transactions on Computers
An efficient method to identify critical gates under circuit aging
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Mitigating Parameter Variation with Dynamic Fine-Grain Body Biasing
Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture
Penelope: The NBTI-Aware Processor
Proceedings of the 40th Annual IEEE/ACM International Symposium on Microarchitecture
NBTI resilient circuits using adaptive body biasing
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Facelift: Hiding and slowing down aging in multicores
Proceedings of the 41st annual IEEE/ACM International Symposium on Microarchitecture
NBTI tolerant microarchitecture design in the presence of process variation
Proceedings of the 41st annual IEEE/ACM International Symposium on Microarchitecture
On the efficacy of input Vector Control to mitigate NBTI effects and leakage power
ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
Gate replacement techniques for simultaneous leakage and aging optimization
Proceedings of the Conference on Design, Automation and Test in Europe
Minimizing leakage power in aging-bounded high-level synthesis with design time multi-Vth assignment
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Leakage power and circuit aging cooptimization by gate replacement techniques
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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With technology scaling, aging effect and leakage pose significant challenge on the reliability of integrated circuits. Existing techniques on co-optimizing circuit aging and leakage either implement in an intrusive way or rely on input vector control (IVC) method. However, intrusive schemes increase the design complexity and induce extra delay and area overheads. IVC method becomes ineffective as the circuit scale increasing. In this paper, a non-intrusive scheme exploiting multiple input vectors (M-IVC) is proposed to co-optimize NBTI-induced degradation and leakage when the circuit steps into standby mode. M-IVC grounds on a new co-optimization model which formulates both the NBTI-induced delay degradation and the average standby leakage as the function of duty cycle. This co-optimization model facilitates to identify a set of optimal duty cycles which result in minimum NBTI-induced degradation and leakage simultaneously. To achieve the optimal duty cycles, an ATPG-like algorithm is proposed to generate multiple input vectors and determine the applying time for each vector. Experimental results demonstrate that with only a small number of vectors, M-IVC can effectively optimize NBTI-induced delay degradation and leakage together and keep the effectiveness as the time of standby period increasing.