Verification-guided soft error resilience

  • Authors:
  • Sanjit A. Seshia;Wenchao Li;Subhasish Mitra

  • Affiliations:
  • UC Berkeley;UC Berkeley;Stanford University

  • Venue:
  • Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 2007

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Abstract

Algorithmic techniques for formal verification can be used not just for bug-finding, but also to estimate vulnerability to reliability problems and to reduce overheads of circuit mechanisms for error resilience. We demonstrate this idea of verification-guided error resilience in the context of soft errors in latches. We show how model checking can be used to identify latches in a circuit that must be protected in order that the circuit satisfies a formal specification. Experimental results on a Verilog implementation of the ESA SpaceWire communication protocol indicate that the power overhead of soft error protection can be reduced by a factor of 4.35 by using our approach rather than protecting all latches.