ICML '99 Proceedings of the Sixteenth International Conference on Machine Learning
Statistical design and optimization of SRAM cell for yield enhancement
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Proceedings of the 43rd annual Design Automation Conference
Breaking the simulation barrier: SRAM evaluation through norm minimization
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
SRAM dynamic stability: theory, variability and analysis
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
SRAM parametric failure analysis
Proceedings of the 46th Annual Design Automation Conference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 47th Design Automation Conference
A statistical simulation method for reliability analysis of SRAM core-cells
Proceedings of the 47th Design Automation Conference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the Conference on Design, Automation and Test in Europe
Statistical static timing analysis using Markov chain Monte Carlo
Proceedings of the Conference on Design, Automation and Test in Europe
Cross-layer resilience challenges: metrics and optimization
Proceedings of the Conference on Design, Automation and Test in Europe
Two fast methods for estimating the minimum standby supply voltage for large SRAMs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Efficient SRAM failure rate prediction via Gibbs sampling
Proceedings of the 48th Design Automation Conference
Rethinking memory redundancy: optimal bit cell repair for maximum-information storage
Proceedings of the 48th Design Automation Conference
Exponent monte carlo for quick statistical circuit simulation
PATMOS'09 Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
Maximum-information storage system: concept, implementation and application
Proceedings of the International Conference on Computer-Aided Design
Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis
Proceedings of the International Conference on Computer-Aided Design
A fast estimation of SRAM failure rate using probability collectives
Proceedings of the 2012 ACM international symposium on International Symposium on Physical Design
Efficient importance sampling for high-sigma yield analysis with adaptive online surrogate modeling
Proceedings of the Conference on Design, Automation and Test in Europe
Leveraging sensitivity analysis for fast, accurate estimation of SRAM dynamic write VMIN
Proceedings of the Conference on Design, Automation and Test in Europe
Cross entropy minimization for efficient estimation of SRAM failure rate
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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Circuit reliability under statistical process variation is an area of growing concern. For highly replicated circuits such as SRAMs and flip flops, a rare statistical event for one circuit may induce a not-so-rare system failure. Existing techniques perform poorly when tasked to generate both efficient sampling and sound statistics for these rare events. Statistical Blockade is a novel Monte Carlo technique that allows us to efficiently filter---to block---unwanted samples insufficiently rare in the tail distributions we seek. The method synthesizes ideas from data mining and Extreme Value Theory, and shows speed-ups of 10X-100X over standard Monte Carlo.