Exponent monte carlo for quick statistical circuit simulation

Authors:
Paul Zuber;Vladimir Matvejev;Philippe Roussel;Petr Dobrovolný;Miguel Miranda
Affiliations:
Smart Systems and Energy Technology, IMEC, Heverlee, Belgium;Dept. of Electronics and Informatics, Vrije Universiteit Brussel, Belgium;Smart Systems and Energy Technology, IMEC, Heverlee, Belgium;Smart Systems and Energy Technology, IMEC, Heverlee, Belgium;Smart Systems and Energy Technology, IMEC, Heverlee, Belgium
Venue:
PATMOS'09 Proceedings of the 19th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
Year:
2009

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Abstract

The main goals of this article are to report an implementation and a quantitative study of Exponent Monte Carlo, an enhanced version of Monte Carlo for verifying high circuit yield in the presence of random process variations. Results on industry-grade standard cell netlists and compact models in 45nm show that EMC predicts reasonable results at least 1,000 times faster than MC.