Numerical recipes in C (2nd ed.): the art of scientific computing
Numerical recipes in C (2nd ed.): the art of scientific computing
Modelling extremal events: for insurance and finance
Modelling extremal events: for insurance and finance
Remembrance of circuits past: macromodeling by data mining in large analog design spaces
Proceedings of the 39th annual Design Automation Conference
A Tutorial on Support Vector Machines for Pattern Recognition
Data Mining and Knowledge Discovery
ICML '99 Proceedings of the Sixteenth International Conference on Machine Learning
Statistical analysis of subthreshold leakage current for VLSI circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Asymptotic probability extraction for non-normal distributions of circuit performance
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Statistical design and optimization of SRAM cell for yield enhancement
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Proceedings of the 43rd annual Design Automation Conference
Data Mining: Practical Machine Learning Tools and Techniques, Second Edition (Morgan Kaufmann Series in Data Management Systems)
Proceedings of the conference on Design, automation and test in Europe
Pareto sampling: choosing the right weights by derivative pursuit
Proceedings of the 47th Design Automation Conference
Two fast methods for estimating the minimum standby supply voltage for large SRAMs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fitting standard cell performance to generalized Lambda distributions
Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI
A new method for multiparameter robust stability distribution analysis of linear analog circuits
Proceedings of the International Conference on Computer-Aided Design
PTrace: derivative-free local tracing of bicriterial design tradeoffs
Proceedings of the International Conference on Computer-Aided Design
Analog test metrics estimates with PPM accuracy
Proceedings of the International Conference on Computer-Aided Design
Classifying circuit performance using active-learning guided support vector machines
Proceedings of the International Conference on Computer-Aided Design
Fast and accurate BER estimation methodology for I/O links based on extreme value theory
Proceedings of the Conference on Design, Automation and Test in Europe
Multidimensional analog test metrics estimation using extreme value theory and statistical blockade
Proceedings of the 50th Annual Design Automation Conference
ITRS 2011 analog EDA challenges and approaches
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Advances in variation-aware modeling, verification, and testing of analog ICs
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
C1C: A configurable, compiler-guided STT-RAM L1 cache
ACM Transactions on Architecture and Code Optimization (TACO)
Scalable and efficient analog parametric fault identification
Proceedings of the International Conference on Computer-Aided Design
Proceedings of the International Conference on Computer-Aided Design
Uncertainty quantification for integrated circuits: stochastic spectral methods
Proceedings of the International Conference on Computer-Aided Design
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Circuit reliability under random parametric variation is an area of growing concern. For highly replicated circuits, e.g., static random access memories (SRAMs), a rare statistical event for one circuit may induce a not-so-rare system failure. Existing techniques perform poorly when tasked to generate both efficient sampling and sound statistics for these rare events. Statistical blockade is a novel Monte Carlo technique that allows us to efficiently filter--to block--unwanted samples that are insufficiently rare in the tail distributions we seek. The method synthesizes ideas from data mining and extreme value theory and, for the challenging application of SRAM yield analysis, shows speedups of 10-100 times over standard Monte Carlo.