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Proceedings of the Conference on Design, Automation and Test in Europe
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Proceedings of the Conference on Design, Automation and Test in Europe
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Proceedings of the Conference on Design, Automation and Test in Europe
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NOCS '11 Proceedings of the Fifth ACM/IEEE International Symposium on Networks-on-Chip
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Editor's note:The prospect of system failure has increased because of device- and chip-level effects in the late CMOS era, such as early-life failure and NBTI. In this article, the authors present novel system-level architecture and design innovations to cope with these lifetime reliability challenges.—Pradip Bose, IBM Research