Proceedings of the conference on Design, automation and test in Europe: Proceedings
Reliability challenges for 45nm and beyond
Proceedings of the 43rd annual Design Automation Conference
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Proceedings of the 43rd annual Design Automation Conference
Circuit Failure Prediction and Its Application to Transistor Aging
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
The impact of NBTI on the performance of combinational and sequential circuits
Proceedings of the 44th annual Design Automation Conference
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
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Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while performance and quality requirements are increasing. One of the key reliability issues is long-term performance degradation due to aging. For safe operation, aging monitoring should be performed on chip, namely using built-in aging sensors (activated from time to time). The purpose of this paper is to present a novel programmable nanometer aging sensor. The proposed aging sensor allows several levels of circuit failure prediction and exhibits low sensitivity to PVT (Process, power supply Voltage and Temperature) variations. Simulation results with a 65 nm sensor design are presented, that ascertain the usefulness of the proposed solution.