Process Variations and their Impact on Circuit Operation
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Simulating the power consumption of large-scale sensor network applications
SenSys '04 Proceedings of the 2nd international conference on Embedded networked sensor systems
Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions
Proceedings of the 43rd annual Design Automation Conference
Design of a wireless sensor network platform for detecting rare, random, and ephemeral events
IPSN '05 Proceedings of the 4th international symposium on Information processing in sensor networks
Energy optimality and variability in subthreshold design
Proceedings of the 2006 international symposium on Low power electronics and design
CASES '06 Proceedings of the 2006 international conference on Compilers, architecture and synthesis for embedded systems
Distributed power-management techniques for wireless network video systems
Proceedings of the conference on Design, automation and test in Europe
Sunflower: full-system, embedded, microarchitecture evaluation
HiPEAC'07 Proceedings of the 2nd international conference on High performance embedded architectures and compilers
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The lifetime of individual nodes in a sensor network depends strongly on the leakage power of the nodes in idle state. With technology scaling, variability in leakage power dissipation of sensor nodes will cause increased variability in their lifetimes. In this article, we analyze how the lifetime variations of sensor nodes affect the performance of the sensor network as a whole. We demonstrate the use of the proposed framework to explore deployment cost versus performance trade-offs for sensor networks. Results indicate that up to 37% improvement in the critical lifetime of a sensor network can be obtained with a 20% increase in deployment cost.